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CLAIM AMENDMENTS
1. (currently amended) An on-chip differential multiple
layer inductor comprises:
a first node on a first layer of a plurality of metal
layers of an integrated circuit;
a second node on the first layer; and
a multi-layer winding on at least some of the plurality of
metal layers, wherein the multi-layer winding is coupled to
the first and second nodes, wherein the multi-layer winding
is symmetrical with respect to the first and second nodes,
and wherein metalization of the winding on each of the at
least some of the plurality of metal layers is in an
approximate range of twenty to eighty percent.
firot partial winding on multiple firot laycro, — wherein tho
first partial winding io opcrably coupled to receive a
firot leg of a differential input;
second partial winding on the multiple first laycro,
wherein the occond partial winding io opcrably coupled to
receive a second leg of the differential input;
third partial winding on multiple occond layers, wherein
the third partial winding io opcrably coupled to a center
tap;
fourth partial winding on the multiple occond laycro,
wherein the fourth partial winding io opcrably coupled to
the center tap; a^d
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interconnecting structure opcrably coupled to the firot,
occond, — third, — and fourth partial windingo Guch that the
firot and third partial windings form a winding that io
symmetrical to a winding formed by the occond and fourth
partial windings.
2. (currently amended) The on-chip differential multiple
layer inductor of claim 1 , wherein the multi-layer winding
further comprises:
first partial winding on at least one of the at least some
of the plurality of metal layers; and
second partial winding on at least another one of the at
least some of the plurality of metal layers, wherein
(
positioning of the second partial winding with respect to
positioning of the first partial winding establishes a
parasitic capacitance that, in combination with inductance
of the on-chip differential multiple layer inductor,
provides a resonant frequency of approximately twice an
operating frequency of the on-chip differential multiple
layer inductor
the third partial winding being positioned with respect to
the firot partial winding and the fourth partial winding
being positioned with respect to the second partial winding
to establish a tuned capacitance ouch that a quality factor
of the on - chip differential multiple layer inductor io
optimized .
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3. (currently amended) The on-chip differential multiple
layer inductor of claim 2, wherein the multi-layer winding
■3r7 — wherein the interconnecting structure further comprises:
the at least one of the at least some of the plurality of
metal layers is an adjacent metal layer to the at least
another one of the at least some of the plurality of metal
layers, wherein the positioning of the first partial
winding is offset from the positioning of the second
partial winding.
a first oct of interconnections for coupling the first
partial winding to the third partial winding; a**d
a second set of interconnections for coupling the second
partial winding to the fourth partial winding, — wherein the
first set of interconnections is symmetrical to the second
set of interconnections .
4. (currently amended) The on-chip differential multiple
layer inductor of claim 1 further comprises at least one of
2, wherein the multi-layer winding comprises :
an unused metal layer of the plurality of the metal layers,
wherein the unused metal layer is between the at least
one
of the at least some of the plurality of metal layers
and
the at least another one of the at least some of the
plurality of metal layers, wherein the positioning of
the
first partial winding is aligned with the positioning
of
the second partial winding.
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the first partial winding including a notched corner to
provide clearance for a bridge of the interconnecting
structure; af*d
the second partial winding including a second notched
corner to provide clearance for a second bridge of the
interconnecting structure .
5. (currently amended) The on-chip differential multiple
layer inductor of claim 1 further comprises:
the at least some of the plurality of metal layers
including thicker metalization layers,
the third partial winding having similar mctalization as
the first partial winding; aftd
the fourth partial winding having similar mctalization as
the second partial winding, — such that yield of integrated
circuits incorporating the on - chip differential multiple
layer inductor increases.
6. (new) The on-chip differential multiple layer inductor
of claim 1 further comprises:
a center tap coupled to the multi-layer winding such that
the multi-layer winding is symmetrical about the center tap
with respect to the first and second nodes.